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Fault Modeling and Defect Level Projections in Digital ICs.
José T. de Sousa
Fernando M. Gonçalves
João Paulo Teixeira
Thomas W. Williams
Published in:
EDAC-ETC-EUROASIC (1994)
Keyphrases
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real time
lower level
levels of abstraction
data mining
three dimensional
decision trees
high level
expert systems
higher level
integrity constraints
modeling language
fault detection
modeling framework
tomographic reconstruction