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Multiple fault testing in systems-on-chip with high-level decision diagrams.

Raimund UbarStephen Adeboye OyeniranMario SchölzelHeinrich Theodor Vierhaus
Published in: IDT (2015)
Keyphrases
  • high level
  • distributed systems
  • complex systems
  • digital circuits
  • expert systems
  • wavelet transform
  • object oriented
  • decision diagrams