A new statistical methodology predicting chip failure probability considering electromigration.
Ted SunAyhan A. MutluMahmudur RahmanPublished in: Microelectron. Reliab. (2013)
Keyphrases
- low cost
- failure rate
- information theoretic
- statistical methods
- statistical approaches
- circuit design
- probability distribution
- high speed
- data driven
- statistical analysis
- programmable logic
- confidence intervals
- high density
- analog vlsi
- real time
- vlsi implementation
- single chip
- statistical model
- evolutionary algorithm