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LFSR-Based Deterministic TPG for Two-Pattern Testing.

Xiaowei LiPaul Y. S. CheungHideo Fujiwara
Published in: J. Electron. Test. (2000)
Keyphrases
  • pattern matching
  • neural network
  • test cases
  • website
  • data sets
  • databases
  • data mining
  • objective function
  • lower bound
  • test data
  • black box