Mura Defect Detection on Compact Camera Module (CCM) Using Metric Learning.
Y. G. KimT. H. ParkPublished in: CASE (2020)
Keyphrases
- metric learning
- defect detection
- distance metric
- distance metric learning
- semi supervised
- pairwise
- dimensionality reduction
- field of view
- feature extraction
- multi task
- distance function
- learning tasks
- feature space
- video camera
- mahalanobis metric
- semi supervised learning
- camera motion
- liquid crystal displays
- machine learning
- background knowledge
- labeled data
- knn
- multiresolution
- high dimensional
- pattern recognition
- image processing