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Chip-Level Substrate Noise Analysis with Emphasis of Vertical Impurity Profile for Isolation.
Daisuke Kosaka
Makoto Nagata
Yoshitaka Murasaka
Atsushi Iwata
Published in:
CICC (2007)
Keyphrases
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data analysis
database
image processing
low cost
data mining
case study
multiscale
multiresolution
high speed
statistical analysis
missing data
additive noise