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Simulation and sensitivity of linear analog circuits under parameter variations by Robust interval analysis.

C.-J. Richard ShiMichael W. Tian
Published in: ACM Trans. Design Autom. Electr. Syst. (1999)
Keyphrases
  • analog circuits
  • interval analysis
  • autocalibration
  • neural network
  • constrained optimization
  • digital circuits
  • fault diagnosis
  • computer vision
  • constraint propagation