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Calibration of Carbon Nanotube Probes for Pico-Newton Order Force Measurement Inside a Scanning Electron Microscope.

Masahiro NakajimaFumihito AraiLixin DongToshio Fukuda
Published in: J. Robotics Mechatronics (2004)
Keyphrases
  • scanning electron microscope
  • data sets
  • information retrieval
  • least squares
  • database
  • machine learning
  • artificial intelligence
  • optical flow