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A New Dynamic Imaging Mode for High-Resolution and High-Bandwidth Atomic Force Microscopy.

Ram Sai GorugantuSrinivasa M. Salapaka
Published in: ACC (2018)
Keyphrases
  • atomic force microscopy
  • high resolution
  • high bandwidth
  • end to end
  • image processing
  • super resolution
  • application specific
  • low latency
  • high density
  • mobile devices