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Impact of Self-heating on Performance and Reliability in FinFET and GAAFET Designs.

Vidya A. ChhabriaSachin S. Sapatnekar
Published in: ISQED (2019)
Keyphrases
  • lower bound
  • three dimensional
  • reliability analysis
  • genetic algorithm
  • e learning
  • data structure
  • user interface
  • evolutionary algorithm
  • multiresolution
  • numerical simulations
  • factors that influence
  • error detection