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Light degradation test and design of thermal performance for high-power light-emitting diodes.

Yen-Fu SuShin-Yueh YangTuan-Yu HungChang-Chun LeeKuo-Ning Chiang
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • high power
  • light emitting diodes
  • image processing
  • low cost
  • high density