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Flip-flop clustering based trace signal selection for post-silicon debug.

Yun ChengHuawei LiYing WangYingke GaoBo LiuXiaowei Li
Published in: VTS (2017)
Keyphrases
  • signal processing
  • high frequency
  • frequency domain
  • cmos technology
  • real time
  • video sequences
  • data model
  • high density
  • flip flops
  • charge coupled device