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Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle.

Bo WanYe WangYutai SuGuicui Fu
Published in: IEEE Access (2020)
Keyphrases
  • maximum entropy principle
  • failure rate
  • maximum entropy
  • generative model
  • highly reliable
  • semiconductor devices
  • computer science
  • bayesian networks
  • search algorithm
  • semi supervised
  • failure modes