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Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle.
Bo Wan
Ye Wang
Yutai Su
Guicui Fu
Published in:
IEEE Access (2020)
Keyphrases
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maximum entropy principle
failure rate
maximum entropy
generative model
highly reliable
semiconductor devices
computer science
bayesian networks
search algorithm
semi supervised
failure modes