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Yutai Su
ORCID
Publication Activity (10 Years)
Years Active: 2017-2024
Publications (10 Years): 5
Top Topics
Hybrid Method
Maximum Entropy
Current Status
Cmos Image Sensor
Top Venues
IECON
IEEE Trans. Instrum. Meas.
Microelectron. Reliab.
Expert Syst. Appl.
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Publications
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Varad Maitra
,
Yutai Su
,
Jing Shi
Virtual metrology in semiconductor manufacturing: Current status and future prospects.
Expert Syst. Appl.
249 (2024)
Ye Wang
,
Bo Wan
,
Guicui Fu
,
Yutai Su
PRNU Estimation of Linear CMOS Image Sensors That Allows Nonuniform Illumination.
IEEE Trans. Instrum. Meas.
70 (2021)
Bo Wan
,
Ye Wang
,
Yutai Su
,
Guicui Fu
Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle.
IEEE Access
8 (2020)
Guicui Fu
,
Yutai Su
,
Wendi Guo
,
Bo Wan
,
Zhongqing Zhang
,
Ye Wang
Life prediction methodology of system-in-package based on physics of failure.
Microelectron. Reliab.
(2018)
Xiujuan Zhao
,
Guicui Fu
,
Yutai Su
A method for determining differential life test scheme for space components.
IECON
(2017)