On Polynomial-Time Testable Combinational Circuits.
Nageswara S. V. RaoShunichi ToidaPublished in: IEEE Trans. Computers (1994)
Keyphrases
- logic circuits
- asynchronous circuits
- special case
- high speed
- low power
- tunnel diode
- logic synthesis
- electronic circuits
- digital circuits
- delay insensitive
- worst case
- analog circuits
- finite automata
- truth table
- np hardness
- database
- approximation algorithms
- similarity measure
- optimal planning
- circuit design
- computational complexity
- website
- analog vlsi
- data mining
- databases