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Resistivity-based modeling of substrate non-uniformity for low-resistivity substrate.

Toshiki KanamotoHisato InabaToshiharu ChibaYasuhiro Ogasahara
Published in: IEICE Electron. Express (2014)
Keyphrases
  • electron microscopy
  • grain size
  • magnetic recording
  • real time
  • room temperature
  • heat flow
  • data sets
  • neural network
  • real world
  • artificial intelligence
  • search engine
  • image processing