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On IEEE P1500's Standard for Embedded Core Test.
Erik Jan Marinissen
Rohit Kapur
Maurice Lousberg
Teresa L. McLaurin
Mike Ricchetti
Yervant Zorian
Published in:
J. Electron. Test. (2002)
Keyphrases
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feature selection
embedded systems
databases
machine learning
artificial intelligence
computer vision
decision making
web services
digital libraries
relational databases
multiresolution