Login / Signup
Transient thermo-reflectance measurements of the thermal conductivity and interface resistance of metallized natural and isotopically-pure silicon.
Pavel L. Komarov
Mihai G. Burzo
Gunhan Kaytaz
Peter E. Raad
Published in:
Microelectron. J. (2003)
Keyphrases
</>
thermal conductivity
high density
surface temperature
single image
low cost
surface roughness
high speed
user interface
photometric stereo
steady state
room temperature
high order
data center
shape from shading
man made
level set
heat transfer
composite materials