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Efficient testing strategies for bit- and digit-serial arrays used in digital signal processors.

Abhijit ChatterjeeRabindra K. RoyJacob A. AbrahamJanak H. Patel
Published in: Digit. Signal Process. (1991)
Keyphrases
  • digital signal processors
  • database
  • learning algorithm
  • test cases
  • computationally expensive
  • signal processing
  • test set
  • bit vector