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An Investigation of the Influence of Light Intensity on Microscopic Imaging in Nanoscale Positioning Measurement.

Xinming FangZijian ZhuChenyang Zhao
Published in: IEEE Trans. Instrum. Meas. (2024)
Keyphrases
  • light intensity
  • dynamic range
  • light source
  • light emitting
  • atomic force microscopy
  • image analysis
  • computer vision