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mm-Wave Through-Load Element for On-Wafer Measurement Applications.

Marc Margalef-RoviraOlivier OccelloAbdelhalim A. SaadiVanessa AvramovicSylvie LépillietLoic VincentManuel J. BarraganEmmanuel PistonoSylvain BourdelChristophe GaquièrePhilippe Ferrari
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2021)
Keyphrases
  • load balancing
  • integrated circuit
  • massively parallel
  • average error
  • neural network
  • semiconductor manufacturing
  • wave propagation
  • genetic algorithm
  • artificial intelligence
  • rms error