Robust methods for EMC-driven routing.

Dirk Theune Ralf Thiele Werner John Thomas Lengauer

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)

Keyphrases

benchmark datasets
machine learning
computational cost
data driven
high dimensional data
cross validation
feature extraction
artificial neural networks
significant improvement
least squares
empirical studies
feature descriptors