Relating integrated circuit yield and time-dependent reliability for various defect density distributions.
Kyungmee O. KimPublished in: IEEE Trans. Reliab. (2006)
Keyphrases
- integrated circuit
- probability density
- probability distribution
- random variables
- weibull distribution
- reliability analysis
- low density
- probability measure
- digital images
- gaussian distribution
- heavy tailed
- electron beam
- travel time
- printed circuit boards
- image processing
- shortest path
- data processing
- probabilistic model
- pattern recognition