Login / Signup

Temperature-dependent characterizations on parasitic capacitance of tapered through silicon via (T-TSV).

Yang LiuZhangming ZhuXiaoxian LiuHuaxi GuLixin Guo
Published in: IEICE Electron. Express (2018)
Keyphrases
  • high speed
  • finite element
  • low cost
  • low power
  • chemical vapor deposition
  • data sets
  • high density
  • database
  • high frequency
  • acyclic database schemes
  • room temperature
  • space charge
  • temperature control