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An Efficient Test Procedure for Functional Faults in semiconductor Random Access Memories.
Yun-Hong Kim
In-Sik Hong
Jun-Mo Jung
Young-Oo Kim
In-Chil Lim
Published in:
J. Circuits Syst. Comput. (1991)
Keyphrases
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random access
test cases
multiview video coding
solid state
flash memory
disk storage
built in self test
fault detection
processing elements
data structure
image quality