Automatic Linearity (IP3) Test with Built-in Pattern Generator and Analyzer.

Foster F. Dai Charles E. Stroud Dayu Yang Shuying Qi

Published in: ITC (2004)

Keyphrases

pattern generator
fully automatic
multi modal
database
real time
neural network
information retrieval
learning algorithm
image segmentation
high speed
data driven
segmentation method
semi automatic
test data
statistical significance