Best of Both Worlds: Integration of Split Manufacturing and Camouflaging into a Security-Driven CAD Flow for 3D ICs.
Satwik PatnaikMohammed AshrafOzgur SinanogluJohann KnechtelPublished in: CoRR (2018)
Keyphrases
- concurrent engineering
- access control
- information security
- data driven
- information flow
- data integration
- security requirements
- computer aided design
- computer aided
- model driven
- process planning
- flow field
- security systems
- security mechanisms
- manufacturing industry
- computer integrated manufacturing
- security issues
- statistical databases
- database
- security policies
- manufacturing systems
- intrusion detection
- object oriented
- production planning
- quality control
- functional requirements
- cyber security
- network security
- petri net
- manufacturing processes
- flow analysis
- flow patterns
- relational databases