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All-digital on-chip monitor for PMOS and NMOS process variability measurement utilizing buffer ring with pulse counter.

Tetsuya IizukaJaehyun JeongToru NakuraMakoto IkedaKunihiro Asada
Published in: ESSCIRC (2010)
Keyphrases
  • real time
  • high speed
  • low cost
  • neural network
  • metadata
  • image processing
  • evolutionary algorithm