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Gate oxide degradation of SiC MOSFET under short-circuit aging tests.

Safa MbarekF. FouquetPascal DherbécourtMohamed MasmoudiOlivier Latry
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • short circuit
  • thin film
  • electron microscopy
  • room temperature
  • induction motor
  • field effect transistors
  • leakage current
  • neural network
  • rough sets
  • low cost
  • x ray