Rapid UHF RFID silicon debug and production testing.

Udaya Shankar Natarajan Hemalatha Shanmugasundaram Prachi Deshpande Chin Soon Wah

Published in: ITC (2007)

Keyphrases

low cost
high speed
test cases
production system
knowledge base
quality control
test data
database
search engine
information systems
production scheduling
parallel programming
software testing
x ray
programming language
artificial intelligence
genetic algorithm