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Classification of Manufacturing Defects in Multicrystalline Solar Cells With Novel Feature Descriptor.
Binyi Su
Haiyong Chen
Yifan Zhu
Weipeng Liu
Kun Liu
Published in:
IEEE Trans. Instrum. Meas. (2019)
Keyphrases
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feature descriptors
pattern recognition
classification accuracy
machine learning
training set
decision trees
support vector machine
image classification
feature selection
feature space
support vector
feature vectors
nearest neighbor
local binary pattern
feature distributions