Comparing Machine Learning and Statistical Process Control for Predicting Manufacturing Performance.
Sibusiso C. KhozaJacomine GroblerPublished in: EPIA (2) (2019)
Keyphrases
- process control
- machine learning and statistical
- manufacturing process
- semiconductor manufacturing
- product quality
- control system
- intelligent control
- manufacturing processes
- quality control
- database
- manufacturing environment
- control charts
- real time
- information systems
- production planning
- manufacturing systems
- artificial intelligence
- data mining
- manufacturing enterprises
- databases