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Vertical stack reliability of GaN-on-Si buffers for low-voltage applications.
Elena Fabris
Matteo Borga
Niels Posthuma
Ming Zhao
Brice De Jaeger
Shuzhen You
Stefaan Decoutere
Matteo Meneghini
Gaudenzio Meneghesso
Enrico Zanoni
Published in:
IRPS (2021)
Keyphrases
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low voltage
leakage current
power line
design considerations
power management
structuring elements
cost effective
cmos technology
image processing
multimedia
learning environment
low cost