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Vertical stack reliability of GaN-on-Si buffers for low-voltage applications.

Elena FabrisMatteo BorgaNiels PosthumaMing ZhaoBrice De JaegerShuzhen YouStefaan DecoutereMatteo MeneghiniGaudenzio MeneghessoEnrico Zanoni
Published in: IRPS (2021)
Keyphrases
  • low voltage
  • leakage current
  • power line
  • design considerations
  • power management
  • structuring elements
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  • low cost