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Ultrahigh Bias Stability of ALD In2O3 FETs Enabled by High Temperature O2 Annealing.
Zhuocheng Zhang
Zehao Lin
Chang Niu
Mengwei Si
Muhammad Ashraful Alam
Peide D. Ye
Published in:
VLSI Technology and Circuits (2023)
Keyphrases
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high temperature
simulated annealing
variance reduction
diesel engine
stability analysis
real time
data sets
real world
image sequences
expert systems
evolutionary algorithm
monte carlo
bias variance