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Ultrahigh Bias Stability of ALD In2O3 FETs Enabled by High Temperature O2 Annealing.

Zhuocheng ZhangZehao LinChang NiuMengwei SiMuhammad Ashraful AlamPeide D. Ye
Published in: VLSI Technology and Circuits (2023)
Keyphrases
  • high temperature
  • simulated annealing
  • variance reduction
  • diesel engine
  • stability analysis
  • real time
  • data sets
  • real world
  • image sequences
  • expert systems
  • evolutionary algorithm
  • monte carlo
  • bias variance