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Effect of Conduction Band Edge States on Coulomb-Limiting Electron Mobility in Cryogenic MOSFET Operation.

Hiroshi OkaTakumi InabaShota IizukaHidehiro AsaiKimihiko KatoTakahiro Mori
Published in: VLSI Technology and Circuits (2022)
Keyphrases
  • electrical properties
  • edge detection
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