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Defect classification in shearography images using convolutional neural networks.

Herberth Birck FröhlichAnalucia Vieira FantinBernardo Cassimiro Fonseca de OliveiraDaniel Pedro WillemannLucas Arrigoni IervolinoMauro Eduardo BenedetArmando Albertazzi Gonçalves Júnior
Published in: IJCNN (2018)
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