Analucia Vieira Fantin

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 2

Top Topics

Defect Classification

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Diego Staub, Analucia Vieira Fantin, Daniel Pedro Willemann, Mauro Eduardo Benedet, Thiago Destri Cabral, Ana Lúcia F. S. d'Almeida, Armando Albertazzi Gonçalves Júnior
Noise Analysis Directly on Shearography Wrapped Phase Maps. IEEE Trans. Instrum. Meas. 73 (2024)
Herberth Birck Fröhlich, Analucia Vieira Fantin, Bernardo Cassimiro Fonseca de Oliveira, Daniel Pedro Willemann, Lucas Arrigoni Iervolino, Mauro Eduardo Benedet, Armando Albertazzi Gonçalves Júnior
Defect classification in shearography images using convolutional neural networks. IJCNN (2018)