Randomized polynomial time identity testing for noncommutative circuits.

Vikraman Arvind Pushkar S. Joglekar Partha Mukhopadhyay S. Raja

Published in: STOC (2017)

Keyphrases

special case
high speed
randomized algorithm
data sets
case study
analog circuits
analog vlsi
database
social networks
test cases
test data
truth table
tunnel diode