A Tolerant Edit Distance for Evaluation and Training of Electron Microscopy Reconstruction Algorithms.
Jan FunkeJonas KleinAlbert CardonaMatthew CookPublished in: CoRR (2015)
Keyphrases
- edit distance
- electron microscopy
- x ray
- low energy
- edit operations
- approximate string matching
- similarity measure
- graph matching
- string edit distance
- distance measure
- graph edit distance
- dissimilarity measure
- string matching
- tree edit distance
- levenshtein distance
- image stacks
- approximate matching
- distance computation
- distance function
- training set