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Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits.
Lakshminarayana Pappu
Michael L. Bushnell
Vishwani D. Agrawal
Mandyam-Komar Srinivas
Published in:
J. Electron. Test. (1998)
Keyphrases
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high speed
statistical analysis
statistically sound
estimation algorithm
data driven
statistical models
estimation accuracy
data mining
power dissipation
information theoretic
robust estimation
accurate estimation
semi parametric
asynchronous circuits
analog vlsi
maximum likelihood criterion