Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance.
Luca PirroP. LiebscherC. BrantzM. KesslerH. HerzogOlaf ZimmerhacklR. JainE. EbrandK. GebauerM. OttoAlban ZakaJan HoentschelPublished in: IRPS (2022)
Keyphrases
- equivalent circuit
- steady state
- data conversion
- circuit design
- physical characteristics
- database
- high speed
- integrated circuit
- high impact
- magnetic field
- power dissipation
- power grid
- defect classification
- floating gate
- field effect transistors
- distribution networks
- data acquisition
- signal processing
- feature extraction
- neural network