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Variability-aware parametric yield enhancement via post-silicon tuning of hybrid redundant MAC units.

Sunil DuttAnshu ChauhanSukumar NandiGaurav Trivedi
Published in: VLSI-DAT (2015)
Keyphrases
  • high speed
  • high density
  • neural network
  • image enhancement
  • multiscale
  • parametric models
  • parameter tuning
  • tuning parameters
  • hybrid learning
  • processing units
  • highly redundant