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Evaluating analog circuit performance in light of MOSFET aging at different time scales.

Husni M. HabalHelmut E. Graeb
Published in: ICICDT (2013)
Keyphrases
  • analog circuits
  • fault diagnosis
  • digital circuits
  • neural network
  • wavelet packet transform
  • real time
  • computer vision
  • control system
  • data flow