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A 47 TOPS/W 10T SRAM-Based Multi-Bit Signed CIM With Self-Adaptive Bias Voltage Generator for Edge Computing Applications.
Lu Lu
Anh-Tuan Do
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2023)
Keyphrases
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random access memory
low voltage
edge detection
power consumption
real time
expert systems
power system
edge detector
edge information
design considerations
computer integrated manufacturing
knowledge base
image processing
data transmission
pseudorandom
high voltage