• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

MicroCrack-Net: A Deep Neural Network With Outline Profile-Guided Feature Augmentation and Attention-Based Multiscale Fusion for MicroCrack Detection of Tantalum Capacitors.

Mingyang ChengChuqiao XuJunliang WangWenjun ZhangYaqin ZhouJie Zhang
Published in: IEEE Trans. Aerosp. Electron. Syst. (2022)
Keyphrases