CANNY EDGE DETECTION
Experts
- Diego Andina
- Noureddine Ellouze
- Zhuowen Tu
- Hussein M. Yahia
- Ehab Elsehely
- Olivier Monga
- Eduardo Todt
- Dariusz Mrozek
- Khalid Daoudi
- Ahmed H. Tewfik
- Dilip R. Patlolla
- Maria Ganzha
- Lihua Yang
- Grégoire Malandain
- Corey Toler-Franklin
- Muhammet Bastan
- Yu Wang
- Jean Pierre Cocquerez
- Aïcha Bouzid
- Dalton D. Lunga
- Emin Anarim
- Humberto Bustince Sola
- Jean Le Bihan
- Muhammad Suzuri Hitam
- Guy Cazuguel
- Zbigniew Kopertowski
- Bernard De Baets
- Chandrasekar Vuppalapati
- Constantin Vertan
- José L. Sanz-González
- Stéphane Mallat
- Charles Tim Batista Garrocho
- Mathieu Lamard
- Rachid Deriche
- Frédéric Truchetet
- Emerson Klippel
- Chao Xu
- Gwénolé Quellec
- Syed Saqib Bukhari
Venues
- CoRR
- IEEE Access
- ICASSP
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- Sensors
- EMBC
- ICPR
- IEEE Trans. Geosci. Remote. Sens.
- ICECS
- ICPR (1)
- IEEE Geosci. Remote. Sens. Lett.
- ICIP (2)
- IEEE Trans. Instrum. Meas.
- EUSIPCO
- SN Comput. Sci.
- ISSPA
- Image Vis. Comput.
- Signal Process.
- IEEE Trans. Medical Imaging
- ICSIPA
- IEEE Trans. Biomed. Eng.
- ICIP
- IEEE Internet Things J.
- VCIP
- SIP
- Int. J. Pattern Recognit. Artif. Intell.
- ICIAR
- Pattern Recognit.
- IGARSS
- SITIS
- ICCV
- ACIVS (1)
- J. Math. Imaging Vis.
- Multim. Tools Appl.
- Vis. Comput.
- IEEE Trans. Syst. Man Cybern. Part B
- J. Vis. Commun. Image Represent.
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