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Mixed level test generation for synchronous sequential circuits using the FOGBUSTER algorithm.
Uwe Gläser
Heinrich Theodor Vierhaus
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
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detection algorithm
matching algorithm
expectation maximization
np hard
dynamic programming
computer vision
clustering algorithm
computational complexity
preprocessing
k means
segmentation algorithm
machine vision
databases
high quality
objective function
test generation