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Preparation and Evaluation of Aligned Naphthacene Thin Films Using Surface Plasmon Excitation.
Tohru Shimaoka
Hiroaki Kobayashi
Kazuki Yamashita
Yasuo Ohdaira
Kazunari Shinbo
Keizo Kato
Futao Kaneko
Published in:
IEICE Trans. Electron. (2006)
Keyphrases
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thin film
grain size
surface reconstruction
neural network
viewpoint
film thickness
short circuit
white light interferometry
three dimensional
artificial neural networks
data collection
high density
chemical vapor deposition
databases
multi view
evaluation method