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Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint.

Erik LarssonStina Edbom
Published in: VLSI-SoC (2005)
Keyphrases
  • test data
  • test cases
  • test set
  • training data
  • data sets
  • high quality
  • testing process
  • training set
  • scheduling problem
  • resource constraints
  • databases
  • image processing
  • query language
  • text classification
  • software testing