Optimization methods for post-bond die-internal/external testing in 3D stacked ICs.
Brandon NoiaKrishnendu ChakrabartyErik Jan MarinissenPublished in: ITC (2010)
Keyphrases
- optimization methods
- internal and external
- optimization method
- optimization problems
- simulated annealing
- global convergence
- stochastic methods
- internal state
- quasi newton
- optimization approaches
- trust region
- bayesian network models
- unconstrained optimization
- continuous optimization
- inverse problems
- external world
- efficient optimization
- metaheuristic
- optimization algorithm
- direct optimization
- stage stochastic programs
- evolutionary algorithm
- evolution strategy
- differential evolution
- test cases